Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist; P. Wang; G. Behan; A. I. Kirkl; A. Hashimoto; M. Shimojo; K. Mitsuishi; M. Takeguchi; E. C. Cosgriff; A. J. D'Alfonso; L. J. Allen; S. J. Findlay

Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

機能制御システム専攻

研究成果: Article › 査読

本文言語	English
ジャーナル	Default journal
出版ステータス	Published - 2010 8月 1

引用スタイル

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title = "Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy",

author = "Nellist, {P. D.} and P. Wang and G. Behan and Kirkl, {A. I.} and A. Hashimoto and M. Shimojo and K. Mitsuishi and M. Takeguchi and Cosgriff, {E. C.} and D'Alfonso, {A. J.} and Allen, {L. J.} and Findlay, {S. J.}",

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TY - JOUR

T1 - Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

AU - Nellist, P. D.

AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Hashimoto, A.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Takeguchi, M.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Findlay, S. J.

PY - 2010/8/1

Y1 - 2010/8/1

M3 - Article

JO - Default journal

JF - Default journal

ER -